VIUN's AI Defect Catalog can be used on different hardware.
Access your AI Defect Catalog from any device with a modern Web Browser.
Use your AI Defect Catalogy directly from Vision Engineering's microscopes.
Use your datasets from your AI Defect Catalog directly with SICK softwares.
Use your AI Defect Catalogy directly from KEYENCE's electronic microscopes.
Use your AI Defect Catalog directly from Horotec's electronic microscopes.
